Entropy matrix based approach for removal of specular reflection

Abstract

Specular reflections are a major hindrance in interpretation of polarized light scattering data.
Identification specular reflection in the backscattered intensity is difficult when the sample is not
plane. Orthogonal polarization measurement based methods have been suggested for removal of
specular reflections. However complete characterization of polarization properties requires
measurement Mueller matrix which is performed using different combinations of input and output
polarization states. In this paper we propose a scheme for use of entropy matrix characterization for
numerically removing the contribution of reflection from an Mueller matrix.